A New Inter-Core Built-In-Self-Test Circuits for Tri-State Buffers in the System on a Chip
نویسندگان
چکیده
A new inter-core BIST circuits for tri-state buffers: T-BIST mainly consists of simple circuits distributed in the relevant blocks. It can give an excellent test-coverage with a little additional hardware. Its configuration is not specified by each SoC structure, so, it is suitable for a general/reusable testable IP.
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